ΕΛΟΤ EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
ΕΛΟΤ EN IEC 63287-2
Abstract
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
Info
Publication Date
2023-05-12
Greek Title
Διατάξεις ημιαγωγών - Κατευθυντήριες οδηγίες αξιολόγησης ημιαγωγών - Μέρος 2: Έννοια της κατατομής αποστολής
English Title
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Standard Stage
Techincal Body
YRelated Documents
IEC 63287-2:2023 - Equivalent
EN IEC 63287-2:2023 - Identical
